Akkaya, A. Et Al. 2018. A Study on the Electronic Properties of SiOxNy/p-Si Interface. SILICON , vol.10, no.6 , 2717-2725.

Akkaya, A., Boyarbay, B., Cetin, H., Yildizli, K., & AYYILDIZ, E., (2018). A Study on the Electronic Properties of SiOxNy/p-Si Interface. SILICON , vol.10, no.6, 2717-2725.

Akkaya, A. Et Al. "A Study on the Electronic Properties of SiOxNy/p-Si Interface," SILICON , vol.10, no.6, 2717-2725, 2018

Akkaya, A. Et Al. "A Study on the Electronic Properties of SiOxNy/p-Si Interface." SILICON , vol.10, no.6, pp.2717-2725, 2018

Akkaya, A. Et Al. (2018) . "A Study on the Electronic Properties of SiOxNy/p-Si Interface." SILICON , vol.10, no.6, pp.2717-2725.

@article{article, author={A. Akkaya Et Al. }, title={A Study on the Electronic Properties of SiOxNy/p-Si Interface}, journal={SILICON}, year=2018, pages={2717-2725} }