Estimation of the section thickness and optical disector height with a simple calibration method

Korkmaz A., Tümkaya L.

Journal of Microscopy, vol.187, no.2, pp.104-109, 1997 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 187 Issue: 2
  • Publication Date: 1997
  • Doi Number: 10.1046/j.1365-2818.1997.2180777.x
  • Journal Name: Journal of Microscopy
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.104-109
  • Keywords: Calibration, Fine focus knob, Optical disector height, Section thickness, Stereology, Thickness sampling fraction
  • Ondokuz Mayıs University Affiliated: Yes

Abstract

The distance between the upper and lower surfaces of a section (i.e. the section thickness) can be measured with a microcator or a shaft encoder. In the present report, an alternative simple method is described for estimating the section thickness where such equipment is not available. The basic principle of the method is based on a calibration method already described in the literature. The main difference is that it enables one to make more precise measurements. Provided that the calibration and measurements are made properly, this method can be used in estimating the section thickness, optical disector heights, and in particular in the determination of the thickness sampling fraction for the optical fractionator.